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Image based measurement systems object recognition & parameter estimation F. van der Heijden
Material type:
TextPublication details: Chichester John Wiley & Sons 1994 Description: viii 338ISBN: 0-471-95062-9Subject(s): Measurement SystemDDC classification: 14.08+14.09
| Item type | Current library | Call number | Materials specified | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| Books | TIFR CAM Library | 14.08+14.09 VAND (Browse shelf(Opens below)) | Available | M5184 |
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| 14.08+13.04 WEIN Light-matter interaction Vol.1 fundamentals & applications | 14.08+13.04+13.07 MAND Optical coherence & quantum optics | 14.08+13.06 HAWK Nature of space & time | 14.08+14.09 VAND Image based measurement systems object recognition & parameter estimation | 14.08+6.05 BUTC Elements of nonlinear optics | 14.08+6.05 MILL Nonlinear optics basic concepts | 14.08+7 HOUZ Cloud dynamics |
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